Welcome

Laboratory for Diagnostics and Non-destructive Testing is a research center performing fundamental and applied research in the field of machine condition monitoring (MCM), nondestructive testing (NDT), related signal processing and sensors. Major directions include IoT for MCM, reconfigurable and adaptive testing and diagnostic system architectures for Industry 4.0, virtual sensors for FDD and NDT for advanced materials and structures.

 

Dean's Award for the Dissertation thesis

Jan Neuzil's PhD thesis was recognized by Dean's Award for the Dissertation thesis. Congratulations!

 

Junior Tech University

We have participated in project Junior Tech University. The aim of this project is to introduce high school students the university environment and let them work on some interesting project which should provide them broader and deeper knowledge and skills in science and research. High school student Kamila Sedlakova supervised by Ing. Ondrej Hanus was working on the testing device for the operational amplifier.

CM 2016 and MFPT 2016, 10-12 October 2016, Hotel Novotel Paris Sud Porte de Charenton, Paris, France

10-12 October 2016, Hotel Novotel Paris Sud Porte de Charenton, Paris, France 

CM 2016 and MFPT 2016The Thirteenth International Conference on Condition Monitoring and Machinery Failure
Prevention Technologies

Conference Organisers
The Conference is being organised by the Condition Monitoring and Diagnostic Technology (COMADIT) group of The British Institute of Non-Destructive Testing, in close co-operation and partnership with the US Society for Machinery Failure Prevention Technology.


The British Institute of Non-Destructive Testing (BINDT) is pleased to invite you to this premier event, the International Conference on Condition Monitoring and Machinery Failure Prevention Technologies.

Quality-Based Multiple-Sensor Fusion in an Industrial Wireless Sensor Network for MCM

A new article in IEEE Transactions on Industrial Electronics: Quality-Based Multiple-Sensor Fusion in an Industrial Wireless Sensor Network for MCM by Ondrej Kreibich, Jan Neuzil and Radislav Smid has been published.

DOI: 10.1109/TIE.2013.2293710

A Distributed Fault Detection System based on IWSN for Machine Condition Monitoring

A new article in IEEE Transactions on Industrial Informatics: A Distributed Fault Detection System based on IWSN for Machine Condition Monitoring by Jan Neuzil, Ondrej Kreibich and Radislav Smid has been published.

This paper introduces a novel framework for Industrial Wireless Sensor Networks used for Machine Condition Monitoring

DOI: 10.1109/TII.2013.2290432

 

 

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